Aries Chip Scale Test Socket Clamshell Test Burn-In CSP Micro BGA Test Socket QFN DSP LGA SRAM DRAM SMT Flash Data Sheets Larsen Associates

ARIES ELECTRONICS / LARSEN ASSOCIATES

Test Sockets, Standard & Custom Adaptors, Conversion, Interconnect Packaging Solutions

Chip Scale Test Sockets: Test & Burn-In of MicroBGA, DSP, LGA, SRAM, DRAM, QFN, Flash Devices, ANY SMT device .4mm pitch & Up.

"Aries, world leader in test socket technology"

Aries Chip Scale Test Sockets: Spring Probes, Data Sheets, & Test Reports

Shows Spring Probes, top and bottom, typical of the Aries Clamshell type test socket family.
( Shown above: Test socket for 14mm to 27mm sq devices, Data sheet 23018)

The family of Aries Clamshell style test sockets consist of four standard sizes of sockets each accommodating a wide range of devices. The socket is screwed to the board with four screws. Electrical contact is by way of pressure spring probes. The sockets are designed to be modified to work with BGAs or LGAs or just about any other type of SMT device regardless of footprint, from 1mm sq up to as large as 55mm square. The exterior of the sockets are standard, and the interior interposer, and the pressure plate, and device guides, are modified to accommodate the users particular style of device.

Chip Scale Test Sockets Test & Burn-In of BGA, MicroBGA, LGA, DSP, QFN, SRAM, DRAM, Flash Devices, &
For Any SMT device.

Now available .4mm pitch and up.

DATA SHEETS

Note: Please review the data sheets below. The drawing on the data sheet shows layout of the socket less the interior portion that is modified for your exact device. For your layout, the center datum point is a common dimension for both the IC and socket. Actual drawings with your device are generated for your approval after receipt of order.

Aries CSP Test socket for devices 1 mm up to 13 mm
PDF: http://www.arieselec.com/products/23017.pdf
HTML: http://www.arieselec.com/Web_Data_Sheets/23017/23017.htm

Aries CSP Test socket for devices 14 mm up to 27 mm
PDF: http://www.arieselec.com/products/23018.pdf
HTML: http://www.arieselec.com/Web_Data_Sheets/23018/23018.htm

Aries CSP Test socket for devices up to 40 mm
PDF: http://www.arieselec.com/products/23019.pdf
HTML: http://www.arieselec.com/Web_Data_Sheets/23019/23019.htm

Aries CSP Test socket for devices 28 mm up to 55 mm
PDF: http://www.arieselec.com/products/23020.pdf
HTML: http://www.arieselec.com/Web_Data_Sheets/23020/23020.htm

Test Reports:

0.50mm Center Probe™ Test Contact
http://www.arieselec.com/RF/Ctr_Pb.pdf

0.50mm Center Probe™Test Contact Return Loss Graph
http://www.arieselec.com/RF/Ctr_Pb5_Graph.pdf

0.80mm Center Probe™ Test Contact
http://www.arieselec.com/RF/Ctr_Pb8_Rev2.pdf

0.80mm Center Probe™ Test Contact Return Loss Graph
http://www.arieselec.com/RF/Ctr_Pb8_Graph.pdf

Center Probe™ CSP DC Measurements w/Cycling
http://www.arieselec.com/RF/Ctr_Pb_CSP_Cyc_DC.pdf

Center Probe™ CSP RF Measurements w/Cycling
http://www.arieselec.com/RF/Ctr_Pb_CSP_Cyc_RF.pdf

Center Probe™ CSP DC Measurements w/o Cycling
http://www.arieselec.com/RF/Ctr_Pb_CSP_DC.pdf

Center Probe™CSP RF Measurements w/o Cycling
http://www.arieselec.com/RF/Ctr_Pb_CSP_RF.pdf

CLICK here for RF Test sockets over 1 GHz

INFO: Reliability and Performance: Two Key Considerations in Evaluating High Performance Test Sockets

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3/20/08