ARIES ELECTRONICS / LARSEN ASSOCIATES
Chip Scale Test & Burn-In Sockets Test & Burn-In of Any SMT Device! CSP BGA LGA QFN DSP SRAM DRAM Flash Devices, etc.
"Aries, the world leader in Spring Probe Test & Burn-In Socket Technology"
Open Top Test Socket Open position
Open Top Burn-in Test Sockets:

NEW, state-of-the-art, line of economical Open Top Burn-in Test Sockets from Aries Electronics. patented.

Aries Electronics is a top innovator in test socket design and these new Open Top Burn In Test Sockets are the best and most cost effective Open Top Burn In Test Sockets on the market.

The new Open Top Burn-In Test sockets add new dimensions in capability by utilizing a "C" contact designed for the performance required by burn-in operations at very economical competitive cost. The new Open Top Burn In Test Sockets are more competitive in terms of price and performance with others on the market and offer much more in terms of Aries stature and stability in the Industry as a leader in innovative and reliable cost effective test socket design.

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6/27/10